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Schichtdickenbestimmung von SiO2-Schichten durch Interferenzmessung im UV-Visible-Bereich

Part of: Angewandte UV-Spektroskopie ; 2
Author: Schmitt, A.
Media Type: Printed Book
Language: German
Published: Ueberlingen, Perkin-Elmer, 1977

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available 2 weeks lendable CHE 777/014-2 107652481